The ability to perform efficient and accurate production testing in high-volume manufacturing facilities is crucial; test systems must be capable of automatically testing and diagnosing faults in the shortest possible time. Automated test equipment (ATE) is designed to address these challenges.
ATE is used in many different industries, testing everything from individual components, such as RF semiconductors, to complete electronic systems. Analog-to-digital conversion is a common function in mixed-signal ATE and requires digitizers with a higher performance than the device under test (DUT). This performance margin ensures the correct characterization of the DUT and plays a pivotal part in the time efficiency of this process.
Associate Professor at Hong Kong University (HKU)
who has implemented a system supporting line scan rates of 10M lines/s
prof. Jakub Čížek, Department of Low Temperature Physics at Charles University, Prague
Associate Professor at Hong Kong University (HKU)
who has implemented a system supporting line scan rates of 10M lines/s
M. Sc. Grzegorz Nitecki, Faculty of Electronics, Military Academy of Technology, Warsaw, Poland
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