Automated Test Equipment - ATE
The ability to perform efficient and accurate production testing in high-volume manufacturing facilities is crucial; test systems must be capable of automatically testing and diagnosing faults in the shortest possible time. Automated test equipment (ATE) is designed to address these challenges.
ATE is used in many different industries, testing everything from individual components, such as RF semiconductors, to complete electronic systems. Analog-to-digital conversion is a common function in mixed-signal ATE and requires digitizers with a higher performance than the device under test (DUT). This performance margin ensures the correct characterization of the DUT and plays a pivotal part in the time efficiency of this process.
- Combination of high sample rates, vertical resolution and wide analog input bandwidth offers the best ATE flexibility including the reduction of system components such as mixers and amplifiers
- Open FPGA for custom real-time digital signal processing
- High data transfer rate is needed to support fast post-processing
- Various form factors simplify system integration and allows for retrofitting new digitizers into existing systems
- ADQ7WB Digitizer
12-bit two channel 5 GSPS/Channel with a 6.5GHz analog bandwidth and up to 7 GBytes/s data transfer rates in PCIe and PXIe formats.
- ADQ7DC Digitizer
14-bit one channel 10 GSPS or two channels at 5 GSPS/Channel with a 3 GHz analog bandwidth and up to 7 GBytes/s data transfer rate in PCIe, PXIe, MTCA, USB, or 10GbE formats.
- ADQ14 Digitizer
14-bit with one to four channels, 500 MSPS to 2 GSPS per channel, up to 1.2 GHz analog bandwidth, and up to 5 GBytes/s data transfer rate.
- ADQ8-8C Digitizer
10-bit eight channel, 1 GSPS per channel, 500 MHz analog bandwidth, and up to 3.2 GBytes/s data transfer rate.
- SDR14TX - Arbitrary Waveform Generator
14-bit two analog channel 2 GHz/Channel.
- Firmware Development Kit for FPGA customization